A xenon test chamber is a type of test equipment that is widely used in environmental testing. It uses a xenon lamp as a light source to simulate sunlight in real environments and can test the light resistance of items. When testing with a xenon aging tester, following the International Electrotechnical Commission (I.E.C.) IEC.68-2-5:1975 (Terrestrial Solar Radiation Simulation) standard ensures that the test results are scientifically sound and reliable.

According to IEC 68-2-5:1975 (Terrestrial Solar Radiation Simulation), a series of tests are required in xenon aging tests, including photo-ageing tests, humidity-heat tests, and temperature-variation tests for articles under simulated solar radiation. Through these tests, possible climate aging problems of the articles can be detected in advance, and corrections and improvements can be made.

The xenon test chamber developed and manufactured by sonacme Technology in-house has been designed and manufactured taking into account the requirements of the IEC 68-2-5:1975 standard to ensure that it provides high quality testing. Equipped with high-quality xenon lamps and advanced control systems, the xenon test chamber can precisely control parameters such as light intensity, frequency, and irradiation time of the light source, and automatically record data during the test, making the test results more precise and accurate.

We analyse the requirements of the IEC 68-2-5 : 1975 standard for test conditions in terms of spectrum, irradiance, temperature and humidity.

Definition of the spectrum: Section 3.1 of the standard describes the spectrum in the chamber as 1.120 kW/m2 ±10 % irradiance in the wavelength range from 280 nm to 3,000 nm. It is also noted that the requirements for spectra are given in IEC 68-2-9, which states in section 2.1 that the description of spectra is based on the definition of the standard solar spectrum given in CIE No. 20, which was superseded in 1989 by CIE No. 85. CIE No. 20 was replaced in 1989 by CIE No. 85, which did not provide a more detailed description of the solar spectrum due to the technical conditions at that time. CIE No. 85 provides a more precise description of the solar spectrum, in particular the UV-band spectra, in intervals of 5 nm or 10 nm.

Light intensity settings: Section 4.4 of the IEC 68-2-5:1975 standard states that the temperature within the enclosure during a light cycle is 40°C or 55°C. During a dark cycle, the temperature within the enclosure is 40°C or 55°C. The temperature of the enclosure during a dark cycle is 40°C or 55°C. The temperature within the enclosure during a dark cycle is 40°C or 55°C. 

During the dark cycle, the temperature within the enclosure is 25°C, but the standard does not specify whether the temperature within the enclosure is the air temperature within the enclosure or the temperature of the blackboard or black markers within the enclosure.

Humidity: IEC 68-2-5 :1975 standard is widely used in the electronics industry, the implementation of the standard, can be used: 0. 68 W / m2 @ 340 nm irradiance, light cycle when the chamber air temperature is set to 40 ℃ or 55 ℃, dark cycle when the chamber air temperature is set to 25 ℃.

Xenon test chamber is not only suitable for electronic products and materials industry, but also widely used in aerospace, automotive, chemical and other industries. In these industries, the role of the xenon test chamber is not only to verify the quality and performance of the product, but also to improve the stability and safety of the product, reduce the cost of product development and testing.

When selecting a xenon aging tester, make sure that the equipment meets the requirements of international standards such as IEC 68-2-5 :1975 and choose a manufacturer with the experience and expertise to ensure the quality and reliability of the equipment as well as to provide excellent after-sales service. The standard was published in 1975 and has not been updated, so there are some technical limitations. For specific test requirements, please contact sonacme technical staff for corresponding test solutions.